Employ present five masks amorphous silicon thin-film transistor design and process flow to realize 5-in: InGaZnO active-matrix liquid crystal display with improved stress stability
Bibliographic Information
- Other Title
-
- Employ present five masks amorphous silicon thin film transistor design and process flow to realize 5 in InGaZnO active matrix liquid crystal display with improved stress stability
- Special issue: Active-matrix flatpanel displays and devices: TFT technologies and FPD materials
- Special issue Active matrix flatpanel displays and devices TFT technologies and FPD materials
Search this article
Journal
-
- Japanese journal of applied physics : JJAP
-
Japanese journal of applied physics : JJAP 50 (3), 2011-03
Tokyo : The Japan Society of Applied Physics
- Tweet
Details 詳細情報について
-
- CRID
- 1520009407252306176
-
- NII Article ID
- 40018777956
-
- NII Book ID
- AA12295836
-
- ISSN
- 00214922
-
- NDL BIB ID
- 11054254
-
- Text Lang
- en
-
- NDL Source Classification
-
- ZM35(科学技術--物理学)
-
- Data Source
-
- NDL
- CiNii Articles