Parasitic Bipolar Effect of a Thin-Film Silicon-on-Insulator Power Metal-Oxide-Semiconductor Field-Effect Transistor at High Temperatures
Bibliographic Information
- Other Title
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- Special Issue : Solid State Devices and Materials
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Journal
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- Japanese journal of applied physics : JJAP
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Japanese journal of applied physics : JJAP 52 (4), 2013-04
The Japan Society of Applied Physics
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Details
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- CRID
- 1520009408021988992
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- NII Article ID
- 40019639397
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- NII Book ID
- AA12295836
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- ISSN
- 00214922
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- NDL BIB ID
- 024441594
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- Text Lang
- en
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- NDL Source Classification
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- ZM35(科学技術--物理学)
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- Data Source
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- NDL
- CiNii Articles