Parasitic Bipolar Effect of a Thin-Film Silicon-on-Insulator Power Metal-Oxide-Semiconductor Field-Effect Transistor at High Temperatures

Details 詳細情報について

• CRID

  1520009408021988992

• NII Article ID

  40019639397

• NII Book ID

  AA12295836

• ISSN

  00214922

• NDL BIB ID

  024441594

• Web Site

  http://id.ndl.go.jp/bib/024441594

  https://ndlsearch.ndl.go.jp/books/R000000004-I024441594

• Text Lang

  en

• NDL Source Classification

  • ZM35(科学技術--物理学)

• Data Source

  • NDL Search
  • CiNii Articles