Parasitic Bipolar Effect of a Thin-Film Silicon-on-Insulator Power Metal-Oxide-Semiconductor Field-Effect Transistor at High Temperatures

Bibliographic Information

Other Title
  • Special Issue : Solid State Devices and Materials

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Journal

Details

  • CRID
    1520009408021988992
  • NII Article ID
    40019639397
  • NII Book ID
    AA12295836
  • ISSN
    00214922
  • NDL BIB ID
    024441594
  • Text Lang
    en
  • NDL Source Classification
    • ZM35(科学技術--物理学)
  • Data Source
    • NDL
    • CiNii Articles

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