On the surface characterization in semiconductor structures using the photoacoustic technique
Bibliographic Information
- Other Title
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- Photoacoustic and Photothermal Phenomena--11th International Conference Kyoto, Japan June 2000
- Photoacoustic and Photothermal Phenomena 11th International Conference Kyoto Japan June 2000
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Journal
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- Analytical Sciences
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Analytical Sciences 17 (-), s288-290, 2001
Tokyo : Japan Society for Analytical Chemistry
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Details 詳細情報について
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- CRID
- 1520009408534591232
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- NII Article ID
- 40005335984
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- NII Book ID
- AA10500785
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- ISSN
- 09106340
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- NDL BIB ID
- 5770529
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- Text Lang
- en
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- NDL Source Classification
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- ZP4(科学技術--化学・化学工業--分析化学)
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- Data Source
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- NDL
- CiNii Articles
