Impact of Body-Biasing Technique on Random Telegraph Noise Induced Delay Fluctuation
書誌事項
- タイトル別名
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- Special Issue : Solid State Devices and Materials
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<jats:p> The statistical nature of random telegraph noise (RTN) induced delay fluctuation is described by measuring 1,655 ROs fabricated in a commercial 40 nm CMOS technology. A small number of samples have a large RTN-induced delay fluctuation. We investigated the impact of the body-biasing technique on RTN-induced circuit delay fluctuation for various substrate bias conditions. The impact of RTN-induced delay fluctuation tends to be reduced by the forward body-biasing technique, but a few ROs still have a large fluctuation. </jats:p>
収録刊行物
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- Japanese journal of applied physics : JJAP
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Japanese journal of applied physics : JJAP 52 (4), 04CE05-, 2013-04
Tokyo : The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1520009408993372416
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- NII論文ID
- 40019638305
- 210000142035
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- NII書誌ID
- AA12295836
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- ISSN
- 00214922
- 13474065
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- NDL書誌ID
- 024439227
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- 本文言語コード
- en
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- NDL 雑誌分類
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- ZM35(科学技術--物理学)
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- データソース種別
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- NDL
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