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Electron microscopic and diffraction study of silicon oxide film
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Journal
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- 電子顕微鏡学会誌
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電子顕微鏡学会誌 10 (1), ????-, 1961-04
東京 : 日本電子顕微鏡学会
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Details 詳細情報について
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- CRID
- 1520010380297521920
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- NII Article ID
- 40018102006
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- NII Book ID
- AN00153100
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- ISSN
- 00220744
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- NDL BIB ID
- 9119785
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- Text Lang
- ja
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- NDL Source Classification
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- ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
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- Data Source
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- NDL Search
- CiNii Articles