An Improved Method for Embedding with Quetol 651 and ERL 4206 for Stereoscopic Observation of Thick Sections under 400 kV Transmission Electron Microscope

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Other Title
  • An Improved Method for Embedding with Q

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Abstract

記事分類: 電気工学--電子工学--電子応用機器--電子顕微鏡

Journal

  • Journal of electron microscopy

    Journal of electron microscopy 36 (3), p133-135, 1987

    Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

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