First-Principles Calculation of Tunneling Current of H2- or NH3-Adsorbed Si(001) Surface in Scanning Tunneling Microscopy

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First Principles Calculation of Tunneling Current of H2 or NH3 Adsorbed Si 001 Surface in Scanning Tunneling Microscopy
Special Issue: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques
Special Issue Scanning Tunneling Microscopy Spectroscopy and Related Techniques

コレクション : 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌

Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP

Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 45 (3B), 2154-2157, 2006-03

Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics