Degradation mechanism for continuous-wave green laser-crystallized polycrystalline silicon n-channel thin-film transistors under low vertical-field hot-carrier stress with different laser annealing powers

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  • Degradation mechanism for continuous wave green laser crystallized polycrystalline silicon n channel thin film transistors under low vertical field hot carrier stress with different laser annealing powers
  • Special issue: Solid state devices and materials
  • Special issue Solid state devices and materials

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