Microanalysis by Means of Energy Loss Spectrometry Using a Field Emission STEM
Bibliographic Information
- Other Title
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- Microanalysis by Means of Energy Loss S
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Abstract
記事分類: 工業材料・材料試験--組織・欠陥試験・非破壊検査
Journal
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- Journal of electron microscopy
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Journal of electron microscopy 26 (4), p277-283, 1977-12
Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
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Details 詳細情報について
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- CRID
- 1520573330885842304
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- NII Article ID
- 40005327582
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- NII Book ID
- AA00697060
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- ISSN
- 00220744
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- NDL BIB ID
- 1917032
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- Text Lang
- en
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- NDL Source Classification
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- ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
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- Data Source
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- NDL
- CiNii Articles