A new technique for enhancing sensitivity of the 2ω method by applying a bismuth film thermoreflectance sensor on top of the metal film-dielectric substrate sample
書誌事項
- タイトル別名
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- A new technique for enhancing sensitivity of the 2 o method by applying a bismuth film thermoreflectance sensor on top of the metal film dielectric substrate sample
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収録刊行物
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- Japanese journal of applied physics : JJAP
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Japanese journal of applied physics : JJAP 50 (4), 2011-04
Tokyo : The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1520853832009608832
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- NII論文ID
- 40018800902
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- NII書誌ID
- AA12295836
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- ISSN
- 00214922
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- NDL書誌ID
- 11075977
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- 本文言語コード
- en
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- NDL 雑誌分類
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- ZM35(科学技術--物理学)
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- データソース種別
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- NDL
- CiNii Articles