Experimental investigation of breakdown voltage and electrical breakdown time delay of commercial gas discharge tubes
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説明
<jats:p> This article presents the experimental results of DC dynamic breakdown voltage <jats:italic>U</jats:italic> <jats:sub>b</jats:sub> for small voltage increase rates and electrical breakdown time delay <jats:italic>t</jats:italic> <jats:sub>d</jats:sub> of commercial gas discharge tubes. It was shown that <jats:italic>U</jats:italic> <jats:sub>b</jats:sub> is a stochastic value with Gauss distribution for voltage increase rates ≥2 V/s. In order to determine the static breakdown voltage <jats:italic>U</jats:italic> <jats:sub>s</jats:sub> as a deterministic quantity, the mean values of the dynamic breakdown voltage <jats:italic>U</jats:italic> <jats:sub>b</jats:sub> as a function of voltage increase rate <jats:italic>k</jats:italic> were extrapolated until the intersection with <jats:italic>U</jats:italic> <jats:sub>b</jats:sub> axis using linear fit. The intersection point (for <jats:italic>k</jats:italic> = 0) correspond to <jats:italic>U</jats:italic> <jats:sub>s</jats:sub> value. Additional experiments were performed in order to verify the temperature stability of these components over the wide temperature range from 25 to 250 °C. The experimental results of electrical breakdown time delay are also presented in the paper. Electrical breakdown time delay if often refereed as delay response and it is also very important parameter of gas filled devices. It was shown when the voltage higher then 310 V is applied to those components, the mean value of electrical breakdown time delay <jats:italic>t</jats:italic> <jats:sub>d</jats:sub> insignificantly varies to the value of relaxation time τ≈1 s, while the breakdown probability is close to one for the voltages higher then 380 V. These facts show that the commercial gas discharge tubes are very reliable for the protection for voltages higher then 380 V. </jats:p>
収録刊行物
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- Japanese journal of applied physics : JJAP
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Japanese journal of applied physics : JJAP 50 (8), 086001-, 2011-08
Tokyo : The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1520853832320430464
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- NII論文ID
- 40018961022
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- NII書誌ID
- AA12295836
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- ISSN
- 00214922
- 13474065
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- NDL書誌ID
- 11211542
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- 本文言語コード
- en
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- NDL 雑誌分類
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- ZM35(科学技術--物理学)
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- データソース種別
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- NDL
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