Nondestructive Measurement of Nonlinear Conduction of Nanoscale Materials, Nanoscale SiO₂, and K0.3MoO₃ by Pulse Photoconductivity Method

Details 詳細情報について

• CRID

  1520853832433171840

• NII Article ID

  40019072897

• NII Book ID

  AA12295836

• ISSN

  00214922

  13474065

• DOI

  10.7567/jjap.50.116602

• NDL BIB ID

  023320691

• Web Site

  http://id.ndl.go.jp/bib/023320691

  https://ndlsearch.ndl.go.jp/books/R000000004-I023320691

• Text Lang

  en

• NDL Source Classification

  • ZM35(科学技術--物理学)

• Data Source

  • NDL
  • Crossref
  • CiNii Articles