Growth and Characterization of YSZ Films on Thermally Oxidized Silicon Substrate

Details 詳細情報について

• CRID

  1520853832600880896

• NII Article ID

  110000553890

• NII Book ID

  AN10431017

• ISSN

  09199888

• NDL BIB ID

  6051473

• Web Site

  http://id.ndl.go.jp/bib/6051473

  https://ndlsearch.ndl.go.jp/books/R000000004-I6051473

• Text Lang

  en

• NDL Source Classification

  • ZM2(科学技術--科学技術一般--大学・研究所・学会紀要)

• Data Source

  • NDL Search
  • CiNii Articles