Filterless Ultraviolet Detector Based on Cerium Fluoride Thin Film Grown by Pulsed Laser Deposition

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Abstract

<jats:p> We report on an ultraviolet photoconductive detector based on cerium fluoride (CeF<jats:sub>3</jats:sub>) thin films. CeF<jats:sub>3</jats:sub> thin films were grown on quartz glass substrates by the pulsed laser deposition (PLD) method. Optimization of the substrate temperature using the PLD method successfully increased the photocurrent of the CeF<jats:sub>3</jats:sub> detector. The photocurrent increases linearly up to at least 600 V. The sample grown at 670 K shows the highest crystallinity and orientation. This sample shows a response in the wavelength range below 310 nm without any filters. Additionally, the measured dielectric-breakdown field of this detector exceeded 15 kV/cm. </jats:p>

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