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Automatic control of sliver thickness by high-frequency capacitance measuring principle-1-Measuring drafting process property
Bibliographic Information
- Other Title
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- Automatic control of sliver thickness by high-frequency capacitance measuring principle 1 Measuring drafting process property
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Journal
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- 静岡大学工学部研究報告 / 静岡大学工学部 編
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静岡大学工学部研究報告 / 静岡大学工学部 編 (18), 1-13, 1968-03
浜松 : 静岡大学工学部
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Details 詳細情報について
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- CRID
- 1520853835125899904
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- NII Article ID
- 110007630093
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- NII Book ID
- AN00103146
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- ISSN
- 05830915
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- NDL BIB ID
- 8233727
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- Text Lang
- ja
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- NDL Source Classification
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- ZM2(科学技術--科学技術一般--大学・研究所・学会紀要)
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- Data Source
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- NDL Search
- CiNii Articles