Electrical and Structural Analyses of Solution-Processed Li-Doped ZnO Thin Film Transistors Exposed to Ambient Conditions

Details 詳細情報について

• CRID

  1520854804706308224

• NII Article ID

  10031140439

• NII Book ID

  AA12295133

• ISSN

  18820778

  18820786

• DOI

  10.7567/apex.6.011101

• NDL BIB ID

  024217403

• Web Site

  http://id.ndl.go.jp/bib/024217403

  https://ndlsearch.ndl.go.jp/books/R000000004-I024217403

  http://stacks.iop.org/1882-0786/6/i=1/a=011101/pdf

• Text Lang

  en

• NDL Source Classification

  • ZM35(科学技術--物理学)

• Data Source

  • NDL Search
  • Crossref
  • CiNii Articles