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Cross-sectional TEM analysis of laser-induced ripple structures on the 4H-SiC single-crystal surface
Bibliographic Information
- Other Title
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- Cross sectional TEM analysis of laser induced ripple structures on the 4H SiC single crystal surface
- 4H-SiC単結晶表面のレーザ誘起リップル構造の断面TEM解析
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Journal
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- 技研所報
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技研所報 45 (2), 74-77, 2009-07
東久留米 : 機械振興協会技術研究所
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Details 詳細情報について
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- CRID
- 1520854804950561664
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- NII Article ID
- 40016767507
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- NII Book ID
- AN00050899
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- ISSN
- 0289243X
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- NDL BIB ID
- 10384618
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- Text Lang
- en
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- NDL Source Classification
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- ZM5(科学技術--科学技術一般--工学・工業)
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- Data Source
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- NDL Search
- CiNii Articles