In situ SEM imaging at temperatures as high as 1450℃

Bibliographic Information

Other Title
  • In situ SEM imaging at temperatures as high as 1450ドC

Search this article

Journal

  • Journal of electron microscopy

    Journal of electron microscopy 51 (6), 347-352, 2002

    Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details 詳細情報について

Report a problem

Back to top