High-resolution electron microscopy study of defect structures in γ-TiAl irradiated with 15 keV He ions in a high-voltage transmission electron microscope

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  • High-resolution electron microscopy study of defect structures in ガンマ TiAl irradiated with 15 keV He ions in a high-voltage transmission electron microscope

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  • Journal of electron microscopy

    Journal of electron microscopy 48 (4), 355-360, 1999

    Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

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