Properties of High Tc Superconducting Quantum Interference Device Microscope with High μ-Metal Needle
Bibliographic Information
- Other Title
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- Properties of High Tc Superconducting Quantum Interference Device Microscope with High ミュー Metal Needle
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Journal
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- Japanese journal of applied physics. Pt. 2, Letters
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Japanese journal of applied physics. Pt. 2, Letters 40 (5A), L431-433, 2001-05-01
Tokyo : Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1521980705451857152
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- NII Article ID
- 110004085539
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- NII Book ID
- AA10650595
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- ISSN
- 00214922
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- NDL BIB ID
- 5769792
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- Text Lang
- en
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- NDL Source Classification
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- ZM35(科学技術--物理学)
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- Data Source
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- NDL
- CiNii Articles
