Recent Advances in Quantitative Convergent Beam Electron Diffraction
Bibliographic Information
- Other Title
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- Recent Advances in Quantitative Converg
- Special Issue:Structure Analysis by Using nm-Sized Electron Probe Techniques and Advanced Electron Microscopy
- Special Issue Structure Analysis by Usi
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Journal
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- Journal of electron microscopy
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Journal of electron microscopy 45 (1), 11-18, 1996
Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
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Details 詳細情報について
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- CRID
- 1521980705683707904
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- NII Article ID
- 10008809784
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- NII Book ID
- AA00697060
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- ISSN
- 00220744
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- NDL BIB ID
- 3951116
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- Text Lang
- en
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- NDL Source Classification
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- ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
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- Data Source
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- NDL
- CiNii Articles