Characterization of Direct Immobilized Probe DNA on Partially Functionalized Diamond Solution-Gate Field-Effect Transistors
Bibliographic Information
- Other Title
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- Characterization of Direct Immobilized Probe DNA on Partially Functionalized Diamond Solution Gate Field Effect Transistors
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Journal
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- Japanese journal of applied physics. Part 2, Letters & express letters
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Japanese journal of applied physics. Part 2, Letters & express letters 45 (42-45), L1114-1117, 2006-11
Tokyo : Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1522543655378488704
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- NII Article ID
- 10018632136
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- NII Book ID
- AA11906093
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- ISSN
- 00214922
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- NDL BIB ID
- 8548069
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- Text Lang
- en
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- NDL Source Classification
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- ZM35(科学技術--物理学)
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- Data Source
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- NDL
- CiNii Articles
