Origins of material contrast in scanning ion microscope images
Search this article
Journal
-
- Journal of electron microscopy
-
Journal of electron microscopy 51 (4), 207-213, 2002
Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
- Tweet
Keywords
Details 詳細情報について
-
- CRID
- 1523388079996480512
-
- NII Article ID
- 10011532051
-
- NII Book ID
- AA00697060
-
- ISSN
- 00220744
-
- NDL BIB ID
- 6275308
-
- Text Lang
- en
-
- NDL Source Classification
-
- ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
-
- Data Source
-
- NDL
- CiNii Articles