27pB32P Electron temperature measurement using soft X-ray in the reversed field pinch TPE-RX

NDL Digital Collections
  • Shimada,T.
    National Institute of Advanced Industrial Science and Technology (AIST)
  • Hirano,Y.
    National Institute of Advanced Industrial Science and Technology (AIST)
  • Koguchi,H.
    National Institute of Advanced Industrial Science and Technology (AIST)
  • Sakakita,H.
    National Institute of Advanced Industrial Science and Technology (AIST)
  • Asai,T.
    National Institute of Advanced Industrial Science and Technology (AIST)
  • Kiyama,M.
    National Institute of Advanced Industrial Science and Technology (AIST)
  • Yagi,Y.
    National Institute of Advanced Industrial Science and Technology (AIST)

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Other Title
  • 27pB32P 逆磁場ピンチ装置TPE-RXにおける軟X線による電子温度計測(ミラー・CT等)

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