Improvement of the Kubelka-Munk Function by introducing Selective Surface Reflection

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  • Suzuka,Masakazu
    Color System Division of Sumika Chemical Analysis Service Co., Ltd.
  • Murata,Yukio
    Color System Division of Sumika Chemical Analysis Service Co., Ltd.

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  • 選択表面反射の導入によるKubelka-Munk関数の改良

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The Kubelka-Munk function is widely used for CCM, however, the predicting accuracy cannot be satisfied in a higher dye concentration range (R' is below 5%). Many reports to improve the linear correlation between dye concentrations and K/S values have been published, such as Pineo, Aspland, Fink-Jensen and L-O-G, etc. These improvements were only based on introducing internal or external Fresnel's reflections. However, the effect is not still satisfied. In this paper we intend to improve the correlation by introducing selective surface reflection (SSR). For this purpose the following formula is proposed. R=R'-f2[(n-1)^2+(n・f1・K/S)^2]/[(n+1)^2+(n・f1・K/S)^2] Where R' and R are the measured and real reflectances, f1 and f2 are the appropriate coefficients, K/S is the real Kubelka-Munk value which is supposed to be calculated by R, and n is the refractive index of the material. By applying th Kubelka-Munk function using calculated R, a better linear correlation was able to be found even in a higher dye concentration range.

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