Determination of Diffusion Coefficients of Self-Interstitials in Ice with a New Method of Observing Climb of Dislocations by X-Ray Topography
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- Goto Kumiko
- Department of Applied Physics, Faculty of Engineering, Hokkaido University
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- Hondoh Takeo
- Department of Applied Physics, Faculty of Engineering, Hokkaido University
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- Higashi Akira
- Department of Applied Physics, Faculty of Engineering, Hokkaido University
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説明
The diffusion coefficients of self-interstitials in ice were determined from the growth processes of interstitial-type dislocation loops and dipoles introduced by cooling on the basis of the fact that the growth takes place by the diffusion of excess interstitials to dislocations. The time variation of their size was obtained by in situ X-ray topographic observations using a high-power X-ray source. By combining the obtained diffusion coefficients and the equilibrium concentration of interstitials previously obtained, it is possible to determine the self-diffusion coefficient Ds in ice. The value of Ds obtained by this method and its activation energy E coincide well with those determined by tracer experiments. This result confirms the interstitial mechanism for self-diffusion in ice.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 25 (3), 351-357, 1986
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詳細情報 詳細情報について
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- CRID
- 1570009752454380672
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- NII論文ID
- 110003910785
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- NII書誌ID
- AA10457675
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- ISSN
- 00214922
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles