Experiment on Memory Diode in Amorphous Semiconductor
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- Kinoshita Akira
- Depertment of Applied Science, Faculty of Engineering, Tokyo Electrical Engineering College
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- Aono Tomoyoshi
- Depertment of Applied Science, Faculty of Engineering, Tokyo Electrical Engineering College
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- Nakano Tomoyasu
- Depertment of Applied Science, Faculty of Engineering, Tokyo Electrical Engineering College
この論文をさがす
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 9 (4), 411-411, 1970
社団法人応用物理学会
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詳細情報 詳細情報について
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- CRID
- 1570009752470384256
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- NII論文ID
- 110003893207
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- NII書誌ID
- AA00690800
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- ISSN
- 00214922
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles