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Development of a Fail-Safe Microprocessor LSI with Self-Diagnosis Mechanism Depending on M-Sequence Code Signature
Journal
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- IEEE Int. Symp. on Dep. Comp
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IEEE Int. Symp. on Dep. Comp
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Details 詳細情報について
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- CRID
- 1570291224954998656
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- NII Article ID
- 10014659873
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- Data Source
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- CiNii Articles
