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D-10-1 Test Case Generation for Embedded Systems by using a Hardware Test Generation Tool
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- Takahashi Hiroshi
- Graduate School of Science and Engineering, Ehime University
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- Higami Yoshinobu
- Graduate School of Science and Engineering, Ehime University
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- Aman Hirohisa
- Graduate School of Science and Engineering, Ehime University
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- Kamayama Tenpei
- Department of Computer Science, Ehime University
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- Kobayashi Shin-ya
- Graduate School of Science and Engineering, Ehime University
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- Takamatsu Yuzo
- Graduate School of Science and Engineering, Ehime University
Bibliographic Information
- Other Title
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- D-10-1 ハードウエアテスト生成ツールを用いた組み込みシステムのテストケース生成について(D-10. ディペンダブルコンピューティング,一般セッション)
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Journal
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- Proceedings of the IEICE General Conference
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Proceedings of the IEICE General Conference 2008 (1), 160-, 2008-03-05
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1570291227370408320
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- NII Article ID
- 110006868153
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- NII Book ID
- AN10471452
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- Text Lang
- ja
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- Data Source
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- CiNii Articles
