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One-dimensional analysis of subthreshold characteristics of SOI-MOSFET considering quantum mechanical effects
Journal
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- 4th International Workshop on Computational Electronics
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4th International Workshop on Computational Electronics 11 1995
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Details 詳細情報について
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- CRID
- 1570572699524337152
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- NII Article ID
- 10006484686
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- Data Source
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- CiNii Articles
