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Direct Measurements, Analysis, and Post-Fabrication Improvement of Noise Margins in SRAM Cells Utilizing DMA SRAM TEG
Journal
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- VLSI Tech. Symp., June, 2005
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VLSI Tech. Symp., June, 2005 128-129, 2005
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Details 詳細情報について
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- CRID
- 1570572701263260416
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- NII Article ID
- 10027932501
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- Data Source
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- CiNii Articles
