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Novel Method of Threshold Voltage Control of Metal Gate CMOSFETs Using Channel Epitaxy
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- KIM W. S.
- Semiconductor R&D Division, Samsung Electronics Co., Ltd.
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- SONG S.
- Semiconductor R&D Division, Samsung Electronics Co., Ltd.
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- KHANG Y.
- Semiconductor R&D Division, Samsung Electronics Co., Ltd.
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- CHOE T. H.
- Semiconductor R&D Division, Samsung Electronics Co., Ltd.
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- YOO J. Y.
- Semiconductor R&D Division, Samsung Electronics Co., Ltd.
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- LEE N. I.
- Semiconductor R&D Division, Samsung Electronics Co., Ltd.
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- FUJIHARA K.
- Semiconductor R&D Division, Samsung Electronics Co., Ltd.
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- KANG H. K.
- Semiconductor R&D Division, Samsung Electronics Co., Ltd.
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- MOON J. T.
- Semiconductor R&D Division, Samsung Electronics Co., Ltd.
Search this article
Journal
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- Extended abstracts of the ... Conference on Solid State Devices and Materials
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Extended abstracts of the ... Conference on Solid State Devices and Materials 2000 458-459, 2000-08-28
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Details 詳細情報について
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- CRID
- 1570854175236483712
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- NII Article ID
- 10017198502
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- NII Book ID
- AA10777858
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- Text Lang
- en
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- Data Source
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- CiNii Articles