Reflection ellipsometry of in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequency : theory and experients
Journal
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- Proc. 32nd European Microwave Conference, 2002
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Proc. 32nd European Microwave Conference, 2002 833-836, 2002
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Details 詳細情報について
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- CRID
- 1570854175870517760
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- NII Article ID
- 10025656343
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- Data Source
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- CiNii Articles