Determination of image aberrations in high-resolution electron microscopy using diffractogram and cross-correlation methods

1 Citations

Journal

  • Optik

    Optik 99 155-166, 1995

Citations (1)*help

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Details 詳細情報について

  • CRID
    1570854176718066944
  • NII Article ID
    80008390813
  • Data Source
    • CiNii Articles

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