The testing and debugging system for embedded systems using concurrent programs

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Bibliographic Information

Other Title
  • 組込み制御用ソフトウェア次世代テスト・デバッグシステム

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Description

Control software for embedded systems is usually written as a concurrent program. Concurrent programs are non-deterministic, and testing and debugging for them is generally more difficult than for sequential programs. This non-deterministic behavior causes a big problem, in that the defects don't always appear in testing or debugging even if the concurrent programs contain them. Therefore it is very difficult to reproduce such defects in debugging process and it takes along time to detect the defects. To resolve this problem, we have developed a system for testing and debugging Java concurrent programs. In this paper, we present the outline and technical aspects of this system.

Journal

  • IPSJ SIG Notes

    IPSJ SIG Notes 122 141-148, 1999-03-18

    Information Processing Society of Japan (IPSJ)

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Details 詳細情報について

  • CRID
    1570854177222557824
  • NII Article ID
    110002931819
  • NII Book ID
    AN10112981
  • ISSN
    09196072
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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