Crystal Structure and Madelung Potential in R<SUB>2−<I>x</I></SUB>Ce<I><SUB>x</SUB></I>CuO<SUB>4−δ</SUB> (R=Pr, Nd, Sm, Eu and Gd) System

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説明

Powder X-ray diffraction measurements were taken in the R2−xCexCuO4−δ (R=Pr, Nd, Sm, Eu and Gd) system. Rietveld refinement of these structures was performed assuming that the space group was I4/mmm. The lattice constant and rare earth metal location were determined to study the electrostatic effects of T′-phase materials. We found that the difference in the Madelung site potential, ΔV (VR-VCu), as well as Tc has a peak for the Cu–O bond length. These data suggest that the carrier concentration is not constant in T′-phase materials and that changes in the carrier concentration influence Tc in these materials.

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詳細情報 詳細情報について

  • CRID
    1570854177349743872
  • NII論文ID
    110003947700
  • NII書誌ID
    AA10650595
  • 本文言語コード
    en
  • データソース種別
    • CiNii Articles

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