Fabrication of Low-Threshold AlGaAs/GaAs Patterned Quantum Well Laser Grown on Si Substrate
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- Hasegawa Yoshiaki
- Department of Electrical and Computer Engineering, Nagoya Institute of Technology
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- Egawa Takashi
- Research Center for Micro-Structure Devices, Nagoya Institute of Technology
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- Jimbo Takashi
- Research Center for Micro-Structure Devices, Nagoya Institute of Technology
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- Umeno Masayoshi
- Department of Electrical and Computer Engineering, Nagoya Institute of Technology
説明
A low-threshold AlGaAs/GaAs patterned quantum well laser has been fabricated on a V-grooved GaAs/Si substrate using metal-organic chemical vapor deposition. High-resolution scanning electron microscope images show that the GaAs active layers with reduced volume are crescent-shaped, whose thicknesses are about 20∼25 nm and widths are about 75∼125 nm. The laser with a 300-μm-long cavity has exhibited the continuous-wave threshold current of as low as 16 mA at 300 K, which is the lowest value for the GaAs-based conventional quantum well lasers on Si.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 32 (7), L997-L999, 1993
公益社団法人 応用物理学会
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詳細情報 詳細情報について
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- CRID
- 1570854178190415360
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- NII論文ID
- 130003474148
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- ISSN
- 00214922
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles