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TEM observation of the cross section of semiconductor laser diode chips : Examination of Focused Ion Beam technique
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- TAMETOU Sayoko
- Matsushita Technoresearch Inc
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- OKANO Tetsuyuki
- Matsushita Technoresearch Inc
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- KOUZAKI Takashi
- Matsushita Technoresearch Inc
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- YABUUCHI Yasufumi
- Matsushita Technoresearch Inc
Bibliographic Information
- Other Title
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- 半導体レーザの断面TEM観察:FIB試料作製法の検討
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Journal
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- 電子顕微鏡
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電子顕微鏡 34 230-, 1999-05-01
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Details 詳細情報について
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- CRID
- 1571135649251801216
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- NII Article ID
- 10004539174
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- NII Book ID
- AN00145000
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- ISSN
- 04170326
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- Text Lang
- ja
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- Data Source
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- CiNii Articles