説明
Abstract This paper deals with a newly developed touch probe which can directly detect the point between the surface of an object being measured and itself. The proposed method is based on the spherical potentiometer; that is, the probe ball is covered with a thin resistant film and four electrodes are symmetrically allocated on the upper part of the probe ball. By measuring the electric resistance between the four electrodes and the contact point, it is possible to determine where the point of contact is located on the probe ball. This paper describes the computer simulation for designing the probe, the development of the probe based on this principle, the system of measurement using the probe and a coordinate measuring machine, and an evaluation of the developed probe according to the results of experiments.
収録刊行物
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- Ann. CIRP
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Ann. CIRP 38 517-, 1989
Elsevier BV
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詳細情報 詳細情報について
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- CRID
- 1571135651400821504
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- NII論文ID
- 30034608069
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- ISSN
- 00078506
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- データソース種別
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- CiNii Articles
- OpenAIRE
