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シランガスと各種シリコン表面の相互作用
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- KOJIMA Tsutomu
- Department of Electronics Faculty of Engineering Tohoku University
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- NAKAMURA Masakazu
- Advanced Gas Technology Center Osaka Sanso Kogyo Ltd.
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- SHIRAI Yasuyuki
- Department of Electronics Faculty of Engineering Tohoku University
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- NARAZAKI Masaki
- Department of Electronics Faculty of Engineering Tohoku University
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- OHMI Tadahiro
- Department of Electronics Faculty of Engineering Tohoku University
Bibliographic Information
- Other Title
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- Silane Gas Interactions with Various Silicon Surface
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Description
シリコン表面上のシランの分解メカニズムは明らかにされていない。以前、我々は異なった希釈ガス,希釈率,シリコン表面に対してシランガスの熱分解特性の評価を行った。その結果、同じガスでも分解開始温度,分解率ならびに分解挙動,活性化エネルギーは著しく異なることが分かった。一方、固体表面のエネルギー準位,気体のイオン化エネルギーや電子親和力などの物性値は周知の数値である。本報告では、これら周知の数値と実験結果から、各種表面におけるシランガスの分解メカニズムを説明する。
Mechanisms for SiH_4 decomposition on Si surfaces are not well understood. Previously, we evaluated the thermal decomposition characteristics of SiH_4 using the various dilution gases and various dilution rates on four kinds of Si surfaces (non-doped Si, SiO_2, n^+Si, and p^+Si) and two halogen terminated surfaces (F, Cl). The results indicated that even for the same gases, the starting decomposition temperature, decomposition rate and the decomposition mechanisms as well as activation energies were quite different. In general, the energy level of solid surface, ionization potential of gas molecule, and electron affinity were widely known. In this report, we present the mechanisms for SiH_4 decomposition on various Si surfaces based on these and the experimental results.
Journal
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- Technical report of IEICE. SDM
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Technical report of IEICE. SDM 95 (194), 21-27, 1995-07-27
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1571135652442728832
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- NII Article ID
- 110003309743
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- NII Book ID
- AN10013254
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- Text Lang
- en
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- Data Source
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- CiNii Articles