Reduction of bending loss by area-selective deposition method
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- Ishii Y.
- Optics and Electronics Laboratory, Fujikura Ltd.
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- Ienaka T.
- Optics and Electronics Laboratory, Fujikura Ltd.
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- Nakai M.
- Optics and Electronics Laboratory, Fujikura Ltd.
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- Tanaka N.
- Optics and Electronics Laboratory, Fujikura Ltd.
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- Hidaka H.
- Optics and Electronics Laboratory, Fujikura Ltd.
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- Wada A.
- Optics and Electronics Laboratory, Fujikura Ltd.
Bibliographic Information
- Other Title
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- 選択デポジションによる曲り導波路の低損失化
Search this article
Journal
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- Proceedings of the IEICE General Conference
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Proceedings of the IEICE General Conference 1998 (1), 314-, 1998-03-06
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1571417127318394368
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- NII Article ID
- 110003252121
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- NII Book ID
- AN10471452
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- Text Lang
- ja
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- Data Source
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- CiNii Articles
