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Analysis of Magnetization Process in Co-Cr Ultra-Thin Film Using the Anomalous Hall Effect
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- SATO Atsushi
- Department of Physical Electronics, Tokyo Institute of Technology
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- TAKAYAMA Kazuhisa
- Department of Physical Electronics, Tokyo Institute of Technology
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- NAKAGAWA Shigeki
- Department of Physical Electronics, Tokyo Institute of Technology
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- NAOE Masahiko
- Department of Physical Electronics, Tokyo Institute of Technology
Bibliographic Information
- Other Title
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- 強磁性 Hall 効果による極薄Co-Cr薄膜の磁化過程解析
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Description
The magnetic characteristics of a Co_<76>Cr_<24> ultra-thin film deposited on a SiO_2/Si substrate by facing targets sputtering, were measured by the anomalous Hall effect. The larger Hall voltage was detected when the thickness of the specimen became thinner. For the specimen with a sufficiently large magnetic anisotropy, the perpendicular magnetization was easily observed with a small magnetic field regardless of the angle of the applied field. The magnetization analysis using the Anomalous Hall effect will be useful for ultra-thin films of novel perpendicular magnetic recording media.
Journal
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- IEICE technical report. Magnetic recording
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IEICE technical report. Magnetic recording 98 (588), 17-22, 1999-02-12
The Institute of Electronics, Information and Communication Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1571698602336632448
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- NII Article ID
- 110003186404
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- NII Book ID
- AN10013050
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- Text Lang
- ja
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- Data Source
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- CiNii Articles
