On the validity of bisection-based thru-only de-embedding
収録刊行物
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- 2010 IEEE International Conference on Microelectronic Test Structures (ICMTS2010)
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2010 IEEE International Conference on Microelectronic Test Structures (ICMTS2010) 2010-03
2010 IEEE International Conference on Microelectronic Test Structures (ICMTS2010)
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詳細情報 詳細情報について
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- CRID
- 1571698602768560384
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- NII論文ID
- 120006702239
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles