Erratum: “SiO Mass Spectrometry and Si-2p Photoemission Spectroscopy for the Study of Oxidation Reaction Dynamics of Si(001) Surface by Supersonic O<sub>2</sub> Molecular Beams under 1000 K”
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 54 (3), 039202-, 2015-02-02
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360566399843229440
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- NII論文ID
- 210000144880
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- ISSN
- 13474065
- 00214922
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- データソース種別
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