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Field Probe Calibration by using TEM cell
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- Goto Yoshitaka
- Kyoritsu Corporation
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- Hariya Eizou
- Kansai Electronic Industry Development Center
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- Sinozaki Atsushi
- Seiko Epson Corporation
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- Sasaki Reiichi
- Kinki University
Bibliographic Information
- Other Title
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- TEMセルによる電界プローブの校正
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Description
It is required to calibrate field probes periodically which is, in electromagnetic (EM) field immunity tests, used to measure its field intesity. This paper describes an outline of the tests concerning with a TEM cell which has been newly developed to calibrate these field probes at the range of 0.1-1000MHz. The characteristics of the TEM ceLL was confirmed by a field probe which was calibrated with the standard EM field generated in the parallel plate and the anechoic chamber. The result indecates that the deviation of the TEM cell field is in ±0.5〜1.5dB.
Journal
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- IEICE technical report. Electromagnetic compatibility
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IEICE technical report. Electromagnetic compatibility 97 (105), 37-43, 1997-06-19
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1571980075182475904
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- NII Article ID
- 10016069354
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- NII Book ID
- AN10013108
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- Text Lang
- ja
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- Data Source
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- CiNii Articles
