Impact of Chip Duty Factor on DS, TH and DS-TH UWB Systems over Multipath and Multi-user Environment

  • SUM Chin Sean
    Department of Electrical and Electronic Engineering, Niigata University
  • SASAKI Shigenobu
    Department of Electrical and Electronic Engineering, Niigata University
  • KIKUCHI Hisakazu
    Department of Electrical and Electronic Engineering, Niigata University

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  • CRID
    1571980075568463744
  • NII論文ID
    10022581793
  • NII書誌ID
    AA11796188
  • 本文言語コード
    en
  • データソース種別
    • CiNii Articles

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