Evaluation of Optical Transfer Function Matrix Measurement on AWG Multiplexers

13 References
  • HARADA Kazunari
    Department of Electrical and Electronics Engineering, Faculty of Science and Technology, Sophia University
  • SUGANO Nobuhiro
    Department of Electrical and Electronics Engineering, Faculty of Science and Technology, Sophia University
  • SHIMIZU Kenji
    Department of Electrical and Electronics Engineering, Faculty of Science and Technology, Sophia University
  • KUDOH Teruhiko
    Department of Electrical and Electronics Engineering, Faculty of Science and Technology, Sophia University
  • OZEKI Takeshi
    Department of Electrical and Electronics Engineering, Faculty of Science and Technology, Sophia University

Bibliographic Information

Other Title
  • AWG波長多重素子の光伝達関数行列の測定評価

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Description

Polarization characteristics on AWG Multiplexers are evaluated by using the optical transfer function matrix. We discribe the optical circuit as the complex transfer function matrix. Then polarization mode dispersion(PMD)and polarization dependent loss(PDL)are defined as the eigen value difference of the frequency derivative operator for the output polarization state and as the eigen value ratio of the power scattering matrix respectively. The optical transfer function matrix of AWG-MUX and its polarization caracteristic are measured. Eye diagram on AWG-MUX using complex transfer function matrix are shown. At last the eye degradation due to PMD is estimated analysisly.

Journal

  • Technical report of IEICE. PS

    Technical report of IEICE. PS 98 (1), 37-42, 1998-04-16

    The Institute of Electronics, Information and Communication Engineers

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Details 詳細情報について

  • CRID
    1571980077314628096
  • NII Article ID
    110003182733
  • NII Book ID
    AA1123312X
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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