Characteristic comparision of GaN epitaxy grown on patterned and unpatterned Si(111)

  • KIM Kyong-Jun
    RCAMD, Research Center of Advanced Materials Department, School of Advanced Materials Engineering, Engineering College, Chonbuk National University
  • SEO In-Seok
    RCAMD, Research Center of Advanced Materials Department, School of Advanced Materials Engineering, Engineering College, Chonbuk National University
  • LEE Cheul-Ro
    RCAMD, Research Center of Advanced Materials Department, School of Advanced Materials Engineering, Engineering College, Chonbuk National University

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詳細情報 詳細情報について

  • CRID
    1572261550532324608
  • NII論文ID
    10022540218
  • NII書誌ID
    AA10777858
  • 本文言語コード
    en
  • データソース種別
    • CiNii Articles

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