Accurate Measurements for Temperature Dependence of Relative Permittivity by the Cavity Perturbation Method
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- TAKAHASHI Takeshi
- Materials Research Center, TDK Corporation
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- IIJIMA Yasushi
- Materials Research Center, TDK Corporation
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- KOBAYASHI Makoto
- Materials Research Center, TDK Corporation
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- MIURA Taro
- Materials Research Center, TDK Corporation
Bibliographic Information
- Other Title
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- 摂動法による比誘電率温度特性評価方法
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Description
A new cavity perturbation method has been proposed as a technique for evaluating the temperature dependence of relative permittivity in the pseudo-microwave range. In order to increase the accuracy of this method, an automatic measuring apparatus which satisfied perturbation principle was constructed and some improvements were employed, such as the resonance curve area method, the comparative resonance curve area method and the periodic least square method. The accuracy of this method was enhanced, reducing the deviation in temperature coefficient of relative permittivity, τε, for the investigated materials to less than ±0.9ppm/℃. Results for some microwave dielectrics demonstrated that measured τε values for this method conform to those of dielectric rod resonator method.
Journal
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- IEICE technical report. Microwaves
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IEICE technical report. Microwaves 96 (74), 57-62, 1996-05-24
The Institute of Electronics, Information and Communication Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1572261552290877952
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- NII Article ID
- 110003189457
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- NII Book ID
- AN10013185
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- Text Lang
- ja
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- Data Source
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- CiNii Articles
