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- TAKAGI Masao
- Takuma National College of Technology
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- HASHIZUME Masaki
- Faculty of Engineering, The Univ. of Tokushima
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- ICHIMIYA Masahiro
- Faculty of Engineering, The Univ. of Tokushima
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- YOTSUYANAGI Hiroyuki
- Faculty of Engineering, The Univ. of Tokushima
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- TAMESADA Takeomi
- Faculty of Engineering, The Univ. of Tokushima
この論文をさがす
説明
In this paper, a test method is proposed to detect lead opens in CMOS LSIs. The test method is based on supply current which flows when test input vectors and AC electric field are provided from the outside of the ICs. Also, an application method of the test input vectors is proposed in this paper. It is shown experimentally that lead opens of SSIs and LSIs will be detected by providing each of the test input vectors per the period of AC electric field applied.
収録刊行物
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- IEICE transactions on fundamentals of electronics, communications and computer sciences
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IEICE transactions on fundamentals of electronics, communications and computer sciences 87 (6), 1330-1337, 2004-06-01
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詳細情報 詳細情報について
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- CRID
- 1572261552371298560
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- NII論文ID
- 110003213039
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- NII書誌ID
- AA10826239
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- ISSN
- 09168508
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles
